9th IEEE International Design & Test Symposium
(IDT�14)
December 16-18, 2014
Sheraton hotel Algiers, Algeria

The International Design and Test Symposium is an IEEE-sponsored technical event devoted to exploring emerging challenges and novel concepts related to the design and test, automation, reliability of electronic systems ranging from integrated circuits through multi-chip modules and printed circuit boards to full systems. IDT is a unique forum to discuss best practices and novel ideas in design methods, tools, test and reliability in the Middle East and Africa (MEA) region. The Symposium is initiated by and in affiliation with the IEEE Test Technology Technical Council (TTTC) and the 2014 edition is organized and sponsored by CDTA (Centre de D�veloppement des Technologies Avanc�es) in collaboration with Nano Micro Electronics Micro and Nano Systems National Network and Blida1University. It is also technically sponsored by IEEE CEDA (Council on Electronic Design Automation). The official language of the conference is English. Topics of interest include but are not limited to: 

Design Methods and Tools

• IP and SOC Design
• Multiprocessor/Multi-core Systems
• Embedded Systems
• DFX
• Analog, Mixed Signal and RF Design
• High Speed Circuits Design
• Design of MEMS and MOEMS
• Low Voltage and Low Power systems
• Innovative Technologies
• Real Time Systems
• Simulation, Validation & Verification
• System Specification and Modeling
• Formal Methods and Verification
• System Design/Synthesis/Optimization

Test and Reliability

• Yield Learning
• IP and SOC Testing
• Multiprocessor/Multi-Core Systems Test
• Memory & FPGA Test & Repair
• Delay Testing
• High Speed, Analog, Mixed Signal & RF Testing
• MEMS/MOEMS Testing
• Defect and Fault Modeling
• DFT, BIST and BISR
• On-line Testing / Fault Tolerance
• Fault Simulation, ATPG
• Reliability Failures/ Modeling
• Circuit Reliability
• Electronic System Reliability

Regular Submissions: IDT�14 invites original, unpublished paper submissions. Paper submissions should be complete manuscripts, not exceeding six pages (inclusive of figures, tables, and bibliography) in a standard IEEE two-column format. Authors should clearly explain the significance of the work, highlight novel features and describe its current status. All submissions are to be made electronically through the IDT�14 website. Detailed instructions for submissions are to be found at the IDT�14 website. A submission will be considered as evidence that, upon acceptance, the author(s) will prepare the final camera-ready version of the paper in time for inclusion in the proceedings, and will present the paper at the conference. All papers will be taken into consideration for the IDT 2014 Best Paper Award. In addition, a set of best papers will be considered for IEEE Design & Test. 

Special Session proposals: IDT�14 solicits Special Sessions, such as (a) Hot-Topic session addressing and discussing the challenges in topics of interest to the symposium, (b) Embedded tutorials introducing and discussing topics of interest to the attendees, (c) Panels discussing visionary and/or controversial issues. Special Session proposals consist of an extended summary (up to 1500 words). as PDF file, describing the session content and format, and must be submitted electronically through the IDT�14 website.

Submission deadline: September 30, 2014 (EXTENDED)

Notification of acceptance: September 19, 2014

Camera-ready manuscript: October 24 , 2014

Publications: IDT�14 will produce a Formal Proceedings of accepted papers, published by the IEEE. The proceedings will be available to all participants during the symposium.

For general information contact

• Mustapha Slamani (slamanim@us.ibm.com)
• Yervant Zorian (Yervant.Zorian@synopsys.com)

For regular submission information contact

• RafikBradai<r.bradai@univ-blida.dz>
• Salvador Mir<Salvador.Mir@imag.fr>)

For Special sessions proposals information contact

• Said Hamdioui, < S.Hamdioui@tudelft.nl>

General Co-Chairs:

• Mustapha Slamani, IBM (USA) 
• Mohand Tahar Belaroussi, CDTA (Alg) 
• Yervant Zorian, Synopsys (USA)

Vice General Co-Chairs

• Abderrezak Guessoum, U B1 (Alg)
• Hazem ElTahawy, Mentor (EG)
• Fadi Kurdahi, UCI (USA)
• Rafik Makki, Global Foundries (USA)

Honorary General Co-Chairs

• Brahim Bouzouia, CDTA (Alg) 
• Mohamed Taher Abadlia, U Blida1(Alg)

Program Co-Chairs

• Rafik Bradai, U B1 (Alg)
• Yassine Djeridane,CDTA (Alg) Salvador Mir, TIMA, (Fr)
• Andre Ivanov, UBC (CA)
• Ashraf Salem, Mentor Graphics (EG)

Vice Program Co-Chairs

• Mountassar Maamoun, UB1 (Alg) 
• Abderrazak Smati CDTA (Alg) 
• Abbas Amira, UWS (UK)
• Arezki Benfdila, U Tizi Ouzou (Alg)

Finance Chair

• Naceur Benzaba,CDTA (Alg)

Publicity Co-Chairs

• Zahia Hadjoub, U Annaba (Alg) 
• Hakim Tahi CDTA (Alg)
• Ozgur Sinanoglu, NY Uni (UAE) 
• Smail Niar, U Valenciennes (FR)

Special Session Co-Chairs

• Ali Mahdoum CDTA (Alg) 
• Said Hamdioui,TU Delft (NL) 
• Samir Dahmani, UB1, (Alg) 
• Paolo Prinetto, Polito (IT)

Industry liaison Co-Chairs

• Salim Aissani, CDTA (Alg) 
• Hocine Aitsaadi, UB1 (Alg) 
• Magdi Abadir, Freescal (USA)

Panels Co-Chair

• Michel Renovell, LIRMM (FR)
• Amine Bermak, HKUST, Hong Kong

Tutorials:

• Ahc�ne Bounceur, UBO (FR)
• Mazen A. R. Saghir, Texas A&M Univ. at Qatar (QA)
• Samir Boubzari,  Qualcom (USA) 
• Hakim Saheb, ADI, (USA)

TTTC Liaison

• C.-H Chiang, Alcatel-Lucent (USA)

Proceedings & Publications

• Amel Chenouf, CDTA (Alg)

Local Arrangement Co-Chairs

• Abdelhalim Slimane, CDTA (Alg) 
• Ahmed Benallal- UB1, (Alg)

The CONFERENCE is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).